Symposium VI – Standard cell layout/characterization

Symposium VI – Standard cell layout/characterization, ECSM puts its number in the same arc as NLDM. The numbers you see in above image, below the cell_rise, cell_fall, rise_transition is all NLDM information. Under rise_transition, you will have ecsm_waveform and ecsm_capacitance. Now this is only one waveform, because we gave it only one load and one slope, just like we have one value under “rise_transition”. If we had 3×3 under rise_transition, then you would have had ecsm_waveform(“0”), ecsm_waveform(“1”), till ecsm_waveform(“8”), essentially 9 waveforms. And same thing with capacitance

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meet our technology partners

Hi Glad to have a prestigious institution (University of Illinois) and a market leader in Library characterization/modelling (Paripath) as our technology partners. For more, read the below link till the end https://www.vlsisystemdesign.com/about-us/ We are being called as “Technology Training Leaders” rather than just “VLSI training institute” by universities and industries… […]

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VIVO – A Popular CCS noise model to find delay change

Its static though, but really efficient….. I am referring to voltage-in-voltage-out VIVO model which is nothing but a current table as a function of input voltage level and output voltage level Here’s the setup to measure dc_current, a very popular pin-level group used for CCS noise modelling. This needs a […]

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