Symposium VI – Standard cell layout/characterization

Symposium VI – Standard cell layout/characterization, ECSM puts its number in the same arc as NLDM. The numbers you see in above image, below the cell_rise, cell_fall, rise_transition is all NLDM information. Under rise_transition, you will have ecsm_waveform and ecsm_capacitance. Now this is only one waveform, because we gave it only one load and one slope, just like we have one value under “rise_transition”. If we had 3×3 under rise_transition, then you would have had ecsm_waveform(“0”), ecsm_waveform(“1”), till ecsm_waveform(“8”), essentially 9 waveforms. And same thing with capacitance

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Symposium V – Machine Intelligence in EDA/CAD applications

Symposium V – Machine Intelligence in EDA/CAD applications- Let’s investigate a simple Wire Resistance Estimate (WiRE) model
This is common design automation problem which is used for estimating timing and power characteristics for analysis and implementation for many steps in ASIC flow. We will restrict our scope to physical implementation only, where known quantity is “length” of wire and resistance is predicted.

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Symposium I – Front-end open-source EDA tool flows for IC design and verification

Question – Who doesn’t want a 3.5X improvement in their code size? I guess everyone wants efficient and effective improvement. Now these are just few tips to have the easy implementation of pipe-line. You are free to implement your ideas in TL-verilog, compile, simulate and see the improvements on your own. For few more tips, you might want to check out below course on “VSD – Pipelining RISC-
V with TL-verilog”

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A prestigious day for us…It can be for you..

A proud moment for our company VLSI System Design Corporation Pvt. Ltd., for my colleague Anagha Ghosh and for myself (See image below)

Our company’s first paper on IEEE explore for technology mediated learning – World’s prestigious institute for engineering and technology innovation. Here’s the link for the paper
https://www.vlsisystemdesign.com/vsdlibrary/

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